Advances in X-Ray Analysis

John V. Gilfrich, I. Cev Noyan, Ron Jenkins, Ting C. Huang, Robert L. Snyder, Deane K. Smith, Mary Ann Zaitz et Paul K. Predecki

ISBN 10: 0306458039 / ISBN 13: 9780306458033

Edité par Kluwer Academic/Plenum Publishers, 1998

A propos de cet article

Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Tome 39. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slight signs of wear on the cover. Volume 39. Ammareal gives back up to 15% of this item's net price to charity organizations.

N° de réf. du vendeur D-607-695

Détails bibliographiques

• Titre: Advances in X-Ray Analysis
• Éditeur: Kluwer Academic/Plenum Publishers
• Date de parution: 1998
• Langue: anglais
• ISBN à 10 chiffres: 0306458039
• ISBN à 13 chiffres: 9780306458033
• Reliure: Hardcover
• État de l'article: Bon

A propos de ce titre

Synopsis

The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sheraton Hotel, Colorado Springs, Colorado. The year 1995 was a special year for the X-ray analysis community, since it represented the 100th anniversary ofthe discovery ofX-rays by Wilhelm Roentgen. In commemoration of this event, the Plenary Session of the conference was entitled "THE ROENTGEN COMMEMORATIVE SESSION:1895-1995, "100 YEARS OF PROGRESS IN X-RA Y SCIENCE AND APPLICATIONS". It is interesting to note that while we celebrate 100 years ofthe use ofX-ray techniques in general, and about 80 years ofX-ray diffraction and spectroscopy in particular, the Denver X-ray Conference has been in place for about half ofthat time period! Like the X-ray methods it represents, the Denver Conference on Applications ofX-ray Analysis has grown and matured, has survived the rigors oftime, and today, provides the worlds' best annual forum for the exchange of experiences and developments in the various fields ofX-ray analysis. Imagine, when the Denver Conference started in 1951, there were no personal computer- in fact, there were no computers, period! There was no SEM, no microprobe, there were no Si(Li) detectors, no transistors, no synchrotrons, Hugo Rietveld was a child, and many members who regularly attend Denver Meetings today, weren't even born yet! As I write this foreword, a copy of volurne 1 of Advances in X-ray Analysis lays in front of me on my desk.