Analysis and Design of Analog Integrated Circuits

Gray, Paul R.,Lewis, Stephen H.,Hurst, Paul J.,Meyer, Robert G.

ISBN 10: 0471321680 / ISBN 13: 9780471321682

Edité par Wiley, 2001

A propos de cet article

Pages include notes, underlining, or highlighting.

N° de réf. du vendeur mon0000639051

Détails bibliographiques

• Titre: Analysis and Design of Analog Integrated Circuits
• Éditeur: Wiley
• Date de parution: 2001
• Langue: anglais
• ISBN à 10 chiffres: 0471321680
• ISBN à 13 chiffres: 9780471321682
• Reliure: hardcover
• Édition: 4ème Édition
• État de l'article: Acceptable

A propos de ce titre

Synopsis

The fourth edition features coverage of cutting edge topics-more advanced CMOS device electronics to include short-channel effects, weak inversion and impact ionization. In this resourceful book find: Coverage of state-of-the-art IC processes shows how modern integrated circuits are fabricated, including recent issues like heterojunction bipolar transistors, copper interconnect and low permittivity dielectric materials Comprehensive and unified treatment of bipolar and CMOS circuits helps readers design real-world amplifiers in silicon.

Quatrième de couverture

THE CLASSIC APPROACH TO CUTTING–EDGE ANALYSIS AND DESIGN

In this Fourth Edition of ANALYSIS AND DESIGN OF ANALOG INTEGRATED CIRCUITS, Paul Gray and Robert Meyer have teamed up with two new coauthors–Paul Hurst and Stephen Lewis–to provide a current, comprehensive and in–depth treatment of analog integrated circuit analysis and design. The authors combine bipolar, CMOS, and BICMOS analog integrated–circuit design into a unified presentation that stresses their commonalties and highlights their differences. Readers will gain valuable insights into the relative strengths and weaknesses of these important technologies.

The Fourth Edition features new and expanded coverage of several key technologies and techniques, including increased emphasis on CMOS circuits in Chapters 3–7; a new chapter covering fully differential amplifiers and common–mode feedback circuit analysis using return ration in addition to the two–part feedback analysis; and new coverage of two–stage MOS op–amp compensation, single–stage op amps, and nested Miller compensation.

FEATURES

• Coverage of cutting–edge topics. The new edition features more advanced CMOS device electronics, including short–channel effects, weak inversion and impact ionization.
• State–of–the–art IC processes. The text shows how modern integrated circuits are fabricated, including recent issues like heterojunction bipolar transistors, copper interconnect, and low permittivity dielectric materials.
• Unified treatment of bipolar and CMOS circuits. This format takes readers through each step in designing real–world amplifiers in silicon.
• Open–ended design problems. A number of open–ended design problems, included in the problem sets, exposes the reader to real–world situations where a range of circuit solutions may be found to satisfy a given performance specification.
• Extensive use of SPICE. SPICE is an integral part of many examples in the problem sets.