Analysis and Design of Resilient VLSI Circuits | Mitigating Soft Errors and Process Variations

Rajesh Garg

ISBN 10: 1489985107 / ISBN 13: 9781489985101

Edité par Springer US, 2014

Analysis and Design of Resilient VLSI Circuits | Mitigating Soft Errors and Process Variations | Rajesh Garg | Taschenbuch | xxii | Englisch | 2014 | Springer US | EAN 9781489985101 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 104974196

Synopsis :

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

Détails bibliographiques

Titre : Analysis and Design of Resilient VLSI ...
Éditeur : Springer US
Date d'édition : 2014
Reliure : Taschenbuch
Etat : Neu