Burn-In Testing: Its Quantification and Optimization

Dimitri Kececioglu; Feng-Bin Sun

ISBN 10: 0133242110 / ISBN 13: 9780133242119

Edité par Prentice Hall, 1997

May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. N° de réf. du vendeur G0133242110I4N00

Synopsis :

32421-0 When scientifically planned and conducted, burn-in testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level. This book covers all aspects of burn-in testing, from basic definitions to state-of-the-art concepts. Drawing on a broad database of studies, Burn-In Testing emphasizes mathematical and statistical models for quantifying the failure process, optimizing component reliability, and minimizing the total cost. Vividly illustrated with figures, tables and charts, Burn-In Testing includes: * Definitions, classifications, and test conditions * A review of failure patterns during burn-in * Seven general mathematical models including four bathtub curve models * A quick calculation approach for time determination * Representative cost models and burn-in time optimization * The bimodal mixed-exponential life distribution applied to quantify and optimize burn-in * The Mean Residual Life (MRL) concept applied to quantify and optimize burn-in * The Total Time on Test (TTT) transform and the TTT plot applied to quantify and optimize burn-in * Accelerated testing and its quantification * A roadmap for practical applications With each chapter, Burn-In Testing also offers the appropriate FORTRAN code for the processes described. Burn-In Testing is ideal for practicing engineers in the fields of reliability, life testing, and product assurance. It is also useful for upper division and graduate students in these and related fields.

À propos de la quatrième de couverture:

32421-0

When scientifically planned and conducted, burn-in testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level.

This book covers all aspects of burn-in testing, from basic definitions to state-of-the-art concepts. Drawing on a broad database of studies, Burn-In Testing emphasizes mathematical and statistical models for quantifying the failure process, optimizing component reliability, and minimizing the total cost.

Vividly illustrated with figures, tables and charts, Burn-In Testing includes:

• Definitions, classifications, and test conditions
• A review of failure patterns during burn-in
• Seven general mathematical models including four bathtub curve models
• A quick calculation approach for time determination
• Representative cost models and burn-in time optimization
• The bimodal mixed-exponential life distribution applied to quantify and optimize burn-in
• The Mean Residual Life (MRL) concept applied to quantify and optimize burn-in
• The Total Time on Test (TTT) transform and the TTT plot applied to quantify and optimize burn-in
• Accelerated testing and its quantification
• A roadmap for practical applications

With each chapter, Burn-In Testing also offers the appropriate FORTRAN code for the processes described.

Burn-In Testing is ideal for practicing engineers in the fields of reliability, life testing, and product assurance. It is also useful for upper division and graduate students in these and related fields.

Détails bibliographiques

Titre : Burn-In Testing: Its Quantification and ...
Éditeur : Prentice Hall
Date d'édition : 1997
Reliure : Unknown
Etat : Very Good
Etat de la jaquette : No Jacket