Data Mining and Diagnosing IC Fails.

Huisman, Leendert M.

ISBN 10: 0387249931 / ISBN 13: 9780387249933

Edité par New York/ NY, Springer US., 2005

A propos de cet article

2005. 16 x 24 cm. XX, 250 S. XX, 250 p. 46 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. (Frontiers in Electronic Testing). Sprache: Englisch. N° de réf. du vendeur 214ZB

Détails bibliographiques

Titre : Data Mining and Diagnosing IC Fails.

Éditeur : New York/ NY, Springer US.

Date d'édition : 2005

Reliure : Couverture rigide

A propos de ce titre

Synopsis :

There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques from other data analysis environments are appropriate for analyzing IC fails, but have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. The description techniques and analysis routines are sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.