Database Modeling with Microsoft® Visio for Enterprise Architects

Hallock, Pat, Halpin, Terry A., Maclean, Bill, Evans, Ken

ISBN 10: 1558609199 / ISBN 13: 9781558609198

Edité par Elsevier Science & Technology, 2003

Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. N° de réf. du vendeur GRP102690204

Synopsis :

This book is for database designers and database administrators using Visio, which is the database component of Microsoft's Visual Studio .NET for Enterprise Architects suite, also included in MSDN subscriptions. This is the only guide to this product that tells DBAs how to get their job done. Although primarily focused on tool features, the book also provides an introduction to data modeling, and includes practical advice on managing database projects. The principal author was the program manager of VEA's database modeling solutions.

À propos des auteurs:

Dr. Terry Halpin is a professor at Northface University. He has led database research teams at several companies including Visio Corporation and Microsoft Corporation, where he worked on the conceptual and logical database modeling technology in Microsoft Visio for Enterprise Architects. His publications include over 100 technical papers and five books.

Ken Evans has taught and applied ORM in English and French for 10 years. His know-how in data and process modeling and complex systems management comes from over 30 years in industry, including international jobs with IBM, EDS, Honeywell Controls, and Plessy and clients among the Fortune 500.

Patrick Hallock, M.S., is the founder of InConcept, a consulting firm, and teaches object modeling throughout the United States. He has been in the industry for 30 years, focusing on database design, with an emphasis on ORM.

Détails bibliographiques

Titre : Database Modeling with Microsoft® Visio for...
Éditeur : Elsevier Science & Technology
Date d'édition : 2003
Reliure : Couverture souple
Etat : Very Good
Edition : 1 Edition.