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Defects and Impurities in Silicon Materials | An Introduction to Atomic-Level Silicon Engineering | Yutaka Yoshida (u. a.) | Taschenbuch | Lecture Notes in Physics | xv | Englisch | 2016 | Springer | EAN 9784431557999 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 104371020
This book emphasizesthe importance of the fascinating atomistic insights into the defects and theimpurities as well as the dynamic behaviors in silicon materials, which havebecome more directly accessible over the past 20 years.
À propos de l?auteur:
Prof. Yutaka Yoshida
Since 2004 Yutaka Yoshida is professor in Materials and Bio Science at Shizuoka Institute of Science and Technology (SIST) Japan. He is also the director of SIST Advanced instrumental analysis center. After obtaining his doctoral degree from Osaka University under the guidance of emeritus Professor F.E. Fujita, and he stayed in the group of Professor Gero Vogl as a guest scientist at the Hahn-Meitner Institute Berlin, Germany, in the period between 1983 and 1985, and 1990, and also as a research assistant at the Institute of solid state physics, Universität Wien, Austria, between 1986 and 1989.
Since 1993 he is a guest Scientist at the RIKEN, Japan. He served for the chairperson of ICAME 2011 at Kobe and also will be the chairperson for 7th Forum of Science and Technology of Silicon Materials 2014 (Hamamatsu).
Titre : Defects and Impurities in Silicon Materials ...
Éditeur : Springer
Date d'édition : 2016
Reliure : Taschenbuch
Etat : Neu
Vendeur : Antiquariat Bookfarm, Löbnitz, Allemagne
Softcover. C-02446 Ex-library with Stamp and Library-Signature in Good Condition, Some Traces of Use 9784431557999 Sprache: Englisch Gewicht in Gramm: 1050. N° de réf. du vendeur 2488308
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Etat : Sehr gut. Zustand: Sehr gut | Seiten: 504 | Sprache: Englisch | Produktart: Bücher | This book emphasizesthe importance of the fascinating atomistic insights into the defects and theimpurities as well as the dynamic behaviors in silicon materials, which havebecome more directly accessible over the past 20 years. Such progress has beenmade possible by newly developed experimental methods, first principle theories,and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The mainpurposes are to provide readers with 1) the basic physics behind defects insilicon materials, 2) the atomistic modeling as well as the characterizationtechniques related to defects and impurities in silicon materials, and 3) anoverview of the wide range of the research fields involved. N° de réf. du vendeur 26000174/202
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Kartoniert / Broschiert. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides the basic physics behind the modeling and evaluation techniques used in silicon materials science Presents atomistic insight into the defects and the impurities in silicon materials such as ULSI, photonic crystals, solar ce. N° de réf. du vendeur 83011767
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book emphasizesthe importance of the fascinating atomistic insights into the defects and theimpurities as well as the dynamic behaviors in silicon materials, which havebecome more directly accessible over the past 20 years. Such progress has beenmade possible by newly developed experimental methods, first principle theories,and computer simulation techniques.The book is aimed at young researchers, scientists, and technicians in related industries. The mainpurposes are to provide readers with 1) the basic physics behind defects insilicon materials, 2) the atomistic modeling as well as the characterizationtechniques related to defects and impurities in silicon materials, and 3) anoverview of the wide range of the research fields involved. 504 pp. Englisch. N° de réf. du vendeur 9784431557999
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book emphasizesthe importance of the fascinating atomistic insights into the defects and theimpurities as well as the dynamic behaviors in silicon materials, which havebecome more directly accessible over the past 20 years. Such progress has beenmade possible by newly developed experimental methods, first principle theoriesand computer simulation techniques.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 504 pp. Englisch. N° de réf. du vendeur 9784431557999
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book emphasizesthe importance of the fascinating atomistic insights into the defects and theimpurities as well as the dynamic behaviors in silicon materials, which havebecome more directly accessible over the past 20 years. Such progress has beenmade possible by newly developed experimental methods, first principle theories,and computer simulation techniques.The book is aimed at young researchers, scientists, and technicians in related industries. The mainpurposes are to provide readers with 1) the basic physics behind defects insilicon materials, 2) the atomistic modeling as well as the characterizationtechniques related to defects and impurities in silicon materials, and 3) anoverview of the wide range of the research fields involved. N° de réf. du vendeur 9784431557999
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