Defects - Recognition, Imaing and Physics in Semiconductors 1999. Proceedings of the Eighth International Conference.

Ogawa, T. and M. Tajima (editors)

Edité par Elsevier Scientific Publishing Co, Amsterdam; (2000)

A propos de cet article

Quarto. 420, (VIII)pp. Collected papers of the meeting on semiconductor researches. Each paper has reference, figures, photographs. Laid-in 8-page Author Index. Bound in pale blue and white cloth, lettering in black, spine lettering in white and black. A fine copy.

N° de réf. du vendeur 010904

Détails bibliographiques

• Titre: Defects - Recognition, Imaing and Physics in Semiconductors 1999. Proceedings of the Eighth International Conference.
• Éditeur: Elsevier Scientific Publishing Co, Amsterdam; (2000)
• Catalogues du vendeur:
  • Science and Technology