Design-For-Test for Digital IC's and Embedded Core Systems

Crouch, Alfred

ISBN 10: 0130848271 / ISBN 13: 9780130848277

Edité par Prentice Hall, 1999

May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. N° de réf. du vendeur G0130848271I4N00

Synopsis :

The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow.

À propos de l?auteur:

AL CROUCH began his testing career repairing meteorological equipment for the U.S. Air Force. He later earned BSEE and MSEE degrees from the University of Kentucky. He has worked for Texas Instruments, Digital Equipment Corporation, and Motorola, focusing on design-for-test, test automation, and computer aided testing. He has been issued nine U.S. Patents and is an experienced trainer and conference presenter.

Détails bibliographiques

Titre : Design-For-Test for Digital IC's and ...
Éditeur : Prentice Hall
Date d'édition : 1999
Reliure : Hardcover
Etat : Very Good
Etat de la jaquette : No Jacket