Digital Circuit Testing: A Guide to DFT and Other Techniques

Wong, Francis C.

ISBN 10: 0127345809 / ISBN 13: 9780127345802

Edité par Academic Press, 1991

A propos de cet article

Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.35.

N° de réf. du vendeur G0127345809I4N01

Détails bibliographiques

• Titre: Digital Circuit Testing: A Guide to DFT and Other Techniques
• Éditeur: Academic Press
• Date de parution: 1991
• Langue: anglais
• ISBN à 10 chiffres: 0127345809
• ISBN à 13 chiffres: 9780127345802
• Reliure: Hardcover
• État de l'article: Very Good
• État de la jaquette: No Jacket

A propos de ce titre

Synopsis

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.