Synopsis
Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer. This rapid advancement is not without its problems, a major one of which is testing. Because of the testing problems arising from the increasing complexity of these devices, new test strategies are emerging. Increasing emphasis is being placed on finding a defect as early as possible in the manufacturing cycle, new algorithms are being devised to create tests for logic circuits, and more attention is being given to design-for-test techniques that require active participation by the logic designers. The first six chapters of this book are concerned with traditional approaches for generating stimuli and applying them to circuits. In Chapter 7 attention is focused on methods for designing testable logic and in Chapter 8 the author looks at some algorithms designed to take advantage of the regularity of memories. In the final chapters, trends and research are examined from different perspectives.
Présentation de l'éditeur
Your road map for meeting today′s digital testing challenges
Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.
There is no single solution to the testing problem. Organized in an easy–to–follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as:
∗ Binary Decision Diagrams (BDDs) and cycle–based simulation
∗ Tester architectures/Standard Test Interface Language (STIL)
∗ Practical algorithms written in a Hardware Design Language (HDL)
∗ Fault tolerance
∗ Behavioral Automatic Test Pattern Generation (ATPG)
∗ The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach
Up–to–date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
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