Digital Logic Testing and Simulation

Miczo, Alexander

ISBN 10: 0471603651 ISBN 13: 9780471603658
Edité par John Wiley & Sons Inc, 1986
Ancien(s) ou d'occasion Hardcover

Vendeur HPB-Red, Dallas, TX, Etats-Unis Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

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Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority! N° de réf. du vendeur S_396887225

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Synopsis :

Book by Miczo Alexander

Présentation de l'éditeur: Your road map for meeting today′s digital testing challenges

Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.

There is no single solution to the testing problem. Organized in an easy–to–follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as:
∗ Binary Decision Diagrams (BDDs) and cycle–based simulation
∗ Tester architectures/Standard Test Interface Language (STIL)
∗ Practical algorithms written in a Hardware Design Language (HDL)
∗ Fault tolerance
∗ Behavioral Automatic Test Pattern Generation (ATPG)
∗ The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach

Up–to–date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Détails bibliographiques

Titre : Digital Logic Testing and Simulation
Éditeur : John Wiley & Sons Inc
Date d'édition : 1986
Reliure : Hardcover
Etat : Acceptable

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Miczo, Alexander
ISBN 10 : 0471603651 ISBN 13 : 9780471603658
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Image d'archives

Miczo, Alexander
Edité par John Wiley & Sons Inc, 1986
ISBN 10 : 0471603651 ISBN 13 : 9780471603658
Ancien ou d'occasion Couverture rigide

Vendeur : HPB-Red, Dallas, TX, Etats-Unis

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Hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! N° de réf. du vendeur S_450543607

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