Digital Systems Testing and Testable Design

Abramovici, Miron; Breuer, Melvin A.; Friedman, Arthur D.

ISBN 10: 0780310624 / ISBN 13: 9780780310629

Edité par Wiley-IEEE Press, 1994

A propos de cet article

N° de réf. du vendeur 36253-n

Détails bibliographiques

Titre : Digital Systems Testing and Testable Design

Éditeur : Wiley-IEEE Press

Date d'édition : 1994

Reliure : Couverture rigide

Etat : New

A propos de ce titre

Quatrième de couverture:

This widely–used textbook provides comprehensive, state–of–the–art coverage of digital systems testing and testable design.

Considered a definitive text in this area, the book includes in–depth discussions of the following topics:

Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built–in self–test Diagnosis

All topics are covered extensively, from fundamental concepts to advanced techniques.

Successfully used world–wide at leading universities, the book is appropriate for graduate–level and senior–level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.