Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs

Robert Anholt

ISBN 10: 089006749X / ISBN 13: 9780890067499

Edité par Artech House Nov 1994, 1994

Neuware - This work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers. N° de réf. du vendeur 9780890067499

Synopsis :

This work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers.

Détails bibliographiques

Titre : Electrical and Thermal Characterization of ...
Éditeur : Artech House Nov 1994
Date d'édition : 1994
Reliure : Buch
Etat : Neu