Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

Evans, Charles; Brundle, Richard; Wilson

ISBN 10: 0750691689 / ISBN 13: 9780750691680

Edité par Butterworth-Heinemann, 1992

A propos de cet article

Book is in very good condition and may include minimal underlining highlighting. The book can also include "From the library of" labels. May not contain miscellaneous items toys, dvds, etc. . We offer 100% money back guarantee and 24 7 customer service.

N° de réf. du vendeur ZBV.0750691689.VG

Détails bibliographiques

• Titre: Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)
• Éditeur: Butterworth-Heinemann
• Date de parution: 1992
• Langue: anglais
• ISBN à 10 chiffres: 0750691689
• ISBN à 13 chiffres: 9780750691680
• Reliure: Couverture rigide
• État de l'article: very_good

A propos de ce titre

Synopsis

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.