Evolution of Thin Film Morphology : Modeling and Simulations

Toh-Ming Lu

ISBN 10: 1441925805 / ISBN 13: 9781441925800

Edité par Springer New York, Springer US, 2010

A propos de cet article

Druck auf Anfrage Neuware - Printed after ordering - Thin lmdepositionisthemostubiquitousandcriticaloftheprocessesusedto manufacture high-tech devices such as microprocessors, memories, solar cells, microelectromechanicalsystems(MEMS),lasers,solid-statelighting,andp- tovoltaics. The morphology and microstructure of thin lms directly controls their optical, magnetic, and electrical properties, which are often signi cantly di erent from bulk material properties. Precise control of morphology and microstructure during thin lm growth is paramount to producing the - sired lm quality for speci c applications. To date, many thin lm deposition techniques have been employed for manufacturing lms, including thermal evaporation,sputterdeposition,chemicalvapordeposition,laserablation,and electrochemical deposition. The growth of lms using these techniques often occurs under highly n- equilibrium conditions (sometimes referred to as far-from-equilibrium), which leads to a rough surface morphology and a complex temporal evolution. As atoms are deposited on a surface, atoms do not arrive at the surface at the same time uniformly across the surface. This random uctuation, or noise, which is inherent to the deposition process, may create surface growth front roughness. The noise competes with surface smoothing processes, such as surface di usion, to form a rough morphology if the experiment is performed at a su ciently low temperature and / or at a high growth rate. In addition, growth front roughness can also be enhanced by growth processes such as geometrical shadowing. Due to the nature of the deposition process, atoms approaching the surface do not always approach in parallel; very often atoms arrive at the surface with an angular distribution.

N° de réf. du vendeur 9781441925800

Détails bibliographiques

• Titre: Evolution of Thin Film Morphology : Modeling and Simulations
• Éditeur: Springer New York, Springer US
• Date de parution: 2010
• Langue: anglais
• ISBN à 10 chiffres: 1441925805
• ISBN à 13 chiffres: 9781441925800
• Reliure: Taschenbuch
• État de l'article: Neu
• Dimensions: 235 L x 155 H x 13 P (en millimètres) 235 millimètres de largeur par 155 millimètres de hauteur par 13 millimètres de profondeur
• Poids: 341 grammes

A propos de ce titre

Synopsis

Thin film deposition is the most ubiquitous and critical of the processes used to manufacture high tech devices. Morphology and microstructure of thin films directly controls their optical, magnetic, and electrical properties. This book focuses on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem both through numerical calculations based on Langevin continuum equations, and through Monte Carlo simulations based on discrete surface growth models when an analytical formulism is not convenient. Evolution of Thin-Film Morphology will be of benefit to university researchers and industrial scientists working in the areas of semiconductor processing, optical coating, plasma etching, patterning, micro-machining, polishing, tribology, and any discipline that requires an understanding of thin film growth processes. In particular, the reader will be introduced to the mathematical tools that are available to describe such a complex problem, and appreciate the utility of the various modeling methods through numerous example discussions. For beginners in the field, the text is written assuming a minimal background in mathematics and computer programming. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition.