Handbook of Microwave Component Measurements

Joel P. Dunsmore

ISBN 10: 1119477131 / ISBN 13: 9781119477136

Edité par John Wiley and Sons Inc, US, 2020

A propos de cet article

Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science.  It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.

N° de réf. du vendeur LU-9781119477136

Détails bibliographiques

• Titre: Handbook of Microwave Component Measurements
• Éditeur: John Wiley and Sons Inc, US
• Date de parution: 2020
• Langue: anglais
• ISBN à 10 chiffres: 1119477131
• ISBN à 13 chiffres: 9781119477136
• Reliure: Hardback
• Édition: 2ème Édition
• État de l'article: New

A propos de ce titre

Synopsis

Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.

À propos de l?auteur

Dr. Joel P. Dunsmore, Research Fellow at Keysight Technologies, California, USA
Since graduating from Oregon State University with a BSEE (1982) and an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies (formerly Agilent Technologies, and Hewlett-Packard) at the Sonoma County Site. He received his Ph.D. from Leeds University in 2004. He was a principle contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and Microwave circuit designs in these products. Recently, he has worked in the area of non-linear test including differential devices, and mixer measurements. He has received 31 patents related to this work, has published numerous articles on measurement technology, as well as consulting on measurement applications. He has taught electrical circuit fundamentals at the local university and co-taught an RF course at the University of California, Berkeley, and presented several short courses and seminars through ARFTG, MTT, EMC, and Keysight.