Handbook of Practical X-Ray Fluorescence Analysis

Burkhard Beckhoff

ISBN 10: 3540286039 / ISBN 13: 9783540286035

Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

A propos de cet article

Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.

N° de réf. du vendeur 9783540286035

Détails bibliographiques

• Titre: Handbook of Practical X-Ray Fluorescence Analysis
• Éditeur: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006
• Date de parution: 2006
• Langue: anglais
• ISBN à 10 chiffres: 3540286039
• ISBN à 13 chiffres: 9783540286035
• Reliure: Buch
• État de l'article: Neu
• Dimensions: 241 L x 160 H x 53 P (en millimètres) 241 millimètres de largeur par 160 millimètres de hauteur par 53 millimètres de profondeur
• Poids: 1502 grammes

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Synopsis

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.