Hardware and Software: Verification and Testing : 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008, Revised Selected Papers

Hana Chockler

ISBN 10: 3642017010 / ISBN 13: 9783642017018

Edité par Springer, Springer, 2009

A propos de cet article

Druck auf Anfrage Neuware - Printed after ordering - These are the conference proceedings of the 4th Haifa Veri cation Conference, held October 27-30, 2008 in Haifa, Israel. This international conference is a unique venue that brings together leading researchers and practitioners of both formal and dynamic veri cation, for both hardware and software systems. This year's conference extended the successes of the previous years, with a largejumpinthenumberofsubmitted papers. Wereceived49totalsubmissions, with many more high-quality papers than we had room to accept. Submissions came from 19 di erent countries, re ecting the growing international visibility of the conference. Of the 49 submissions, 43 were regular papers, 2 of which were later withdrawn, and 6 were tool papers. After a rigorous review process, in which each paper received at least four independent reviews from the dist- guished Program Committee, we accepted 12 regular papers and 4 tools papers for presentation at the conference and inclusion in this volume. These numbers give acceptance rates of 29% for regular papers and 67% for tool papers (34% combined) - comparable to the elite, much older, conferences in the eld. A Best Paper Award, selected on the basis of the reviews and scores from the Program Committee, was presented to Edmund Clarke, Alexandre Donz e, and AxelLegayfortheirpaperentitled'StatisticalModelCheckingofMixed-Analog Circuits with an Application to a Third-Order Delta-Sigma Modulator. ' The refereed program was complemented by an outstanding program of - vited talks, panels, and special sessions from prominent leaders in the eld.

N° de réf. du vendeur 9783642017018

Détails bibliographiques

• Titre: Hardware and Software: Verification and Testing : 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008, Revised Selected Papers
• Éditeur: Springer, Springer
• Date de parution: 2009
• Langue: anglais
• ISBN à 10 chiffres: 3642017010
• ISBN à 13 chiffres: 9783642017018
• Reliure: Taschenbuch
• État de l'article: Neu
• Dimensions: 235 L x 155 H x 13 P (en millimètres) 235 millimètres de largeur par 155 millimètres de hauteur par 13 millimètres de profondeur
• Poids: 353 grammes

A propos de ce titre

Synopsis

These are the conference proceedings of the 4th Haifa Veri?cation Conference, held October 27-30, 2008 in Haifa, Israel. This international conference is a unique venue that brings together leading researchers and practitioners of both formal and dynamic veri?cation, for both hardware and software systems. This year's conference extended the successes of the previous years, with a largejumpinthenumberofsubmitted papers. Wereceived49totalsubmissions, with many more high-quality papers than we had room to accept. Submissions came from 19 di?erent countries, re?ecting the growing international visibility of the conference. Of the 49 submissions, 43 were regular papers, 2 of which were later withdrawn, and 6 were tool papers. After a rigorous review process, in which each paper received at least four independent reviews from the dist- guished Program Committee, we accepted 12 regular papers and 4 tools papers for presentation at the conference and inclusion in this volume. These numbers give acceptance rates of 29% for regular papers and 67% for tool papers (34% combined) -- comparable to the elite, much older, conferences in the ?eld. A Best Paper Award, selected on the basis of the reviews and scores from the Program Committee, was presented to Edmund Clarke, Alexandre Donz´ e, and AxelLegayfortheirpaperentitled"StatisticalModelCheckingofMixed-Analog Circuits with an Application to a Third-Order Delta-Sigma Modulator. " The refereed program was complemented by an outstanding program of - vited talks, panels, and special sessions from prominent leaders in the ?eld.