High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
Adams, R. Dean
ISBN 10: 1402072554 ISBN 13: 9781402072550
Edité par Springer, 2002
Ancien(s) ou d'occasion
Hardcover
Vendeur
Mispah books, Redhill, SURRE, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
Vendeur AbeBooks depuis 15 avril 2021
Cet article spécifique n'est plus disponible.
A propos de cet article
Description :
Like New. Ships from Multiple Locations. N° de réf. du vendeur ERICA77314020725546
Synopsis :
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Détails bibliographiques
Titre : High Performance Memory Testing: Design ...
Éditeur : Springer
Date d'édition : 2002
Reliure : Hardcover
Etat : Like New
Type de livre : book
Meilleurs résultats de recherche sur AbeBooks
Image d'archives
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Vendeur : BennettBooksLtd, San Diego, NV, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
hardcover. Etat : New. In shrink wrap. Looks like an interesting title! N° de réf. du vendeur Q-1402072554
Acheter neuf
EUR 117,13
EUR 5,94 shipping
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 1 disponible(s)
Image d'archives
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
Vendeur : SatelliteBooks, Burlington, VT, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Hardcover. Etat : New. Hardcover, /no DJunused, minor shelf-wearFree of any markings and no writing. For Additional Information or pictures, Please Inquire. N° de réf. du vendeur SKU002924
Acheter neuf
EUR 122,35
EUR 4,70 shipping
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
High Performance Memory Testing
impression à la demandeVendeur : moluna, Greven, Allemagne
Évaluation du vendeur 4 sur 5 étoiles
Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were. N° de réf. du vendeur 4094950
Acheter neuf
EUR 136,16
EUR 48,99 shipping
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image d'archives
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur ABLIING23Mar2411530144582
Acheter neuf
EUR 157,13
EUR 3,41 shipping
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image fournie par le vendeur
High Performance Memory Testing
Edité par
Springer US Sep 2002, 2002
ISBN 10 : 1402072554
ISBN 13 : 9781402072550
Neuf
Couverture rigide
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 266 pp. Englisch. N° de réf. du vendeur 9781402072550
Acheter neuf
EUR 160,49
EUR 23 shipping
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : 2 disponible(s)
Image fournie par le vendeur
High Performance Memory Testing
Edité par
Springer US, Springer US Sep 2002, 2002
ISBN 10 : 1402072554
ISBN 13 : 9781402072550
Neuf
Couverture rigide
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 266 pp. Englisch. N° de réf. du vendeur 9781402072550
Acheter neuf
EUR 160,49
EUR 60 shipping
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
Edité par
Springer US, Springer US, 2002
ISBN 10 : 1402072554
ISBN 13 : 9781402072550
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. N° de réf. du vendeur 9781402072550
Acheter neuf
EUR 166,62
EUR 62,84 shipping
Expédition depuis Allemagne vers Etats-Unis
Expédition depuis Allemagne vers Etats-Unis
Quantité disponible : 1 disponible(s)
Image d'archives
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
Vendeur : Blue Lantern Media, Bloomfield Hills, MI, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
Hardcover. Etat : New. SIGNED BY AUTHOR. Springer-Verlag New York Inc., United States, 2002. Hardcover. Condition: New. 2003 ed. Language: English. Seller Inventory # 0000019. Signed by Author(s). N° de réf. du vendeur 0000020
Acheter neuf
EUR 260,51
EUR 2,56 shipping
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 1 disponible(s)
Image d'archives
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
Vendeur : Toscana Books, AUSTIN, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Hardcover. Etat : new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. N° de réf. du vendeur Scanned1402072554
Acheter neuf
EUR 267,60
EUR 3,67 shipping
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 1 disponible(s)