535 pages in very good condition. Volume III, covering the year 1989. Pages are clean and unmarked with black and white illustrations throughout. Page edges are lightly smudged. Bound in yellow card covers with black titles. Some markings on the upper cover and spine. Spine is wrinkled. Lightly worn around the edges. VG Size: 8 1/2 x 11.

N� de r�f. du vendeur 232179

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D�tails bibliographiques

Titre

INTEGRATED CIRCUIT METROLOGY, INSPECTION, AND PROCESS CONTROL III

�diteur

SPIE - The International Society for Optical Engineering, Bellingham, WA

Date de parution

1989

Reliure

Soft cover

�tat de l'article

Very Good

Type de livre

Book

Catalogues du vendeur

Science

Description de la librairie

Online bookseller, previously owner of Book Bazaar, established in 1974.

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Informations commerciales relatives au vendeur

J. Wyatt Books
ON, Canada

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Visa, MasterCard accepted. 5% GST will be added to Canadian orders. All books guaranteed as described and may be returned within 5 days of receipt and notification. Restocking charges may apply. Shipping costs are the responsibility of the buyer. AIRmail includes insurance. Surface mail outside Canada and U.S.A. does not include insurance and will be at the buyer's risk. Online books are in a separate location from my bookstore.

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