4to, paperback. Vg condition. Ex-lib copy w/ light markings to opening pgs, spine label neatly removed; spine mildly smudged, contents bright & clean, binding tight. 553 p.

N� de r�f. du vendeur 1051216.02

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D�tails bibliographiques

Titre: Integrated Circuit Metrology, Inspection, and Process Control VIII: 28 February - 2 March, San Jose, California [SPIE Proceedings, Volume 2196]
�diteur: International Society for Optical Engineering (SPIE), Bellingham, Wash.
Date de parution: 1994
Langue: anglais
ISBN � 10 chiffres: 0819414913
ISBN � 13 chiffres: 9780819414915
Reliure: Paperback
�tat de l'article: Very Good

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