Introduction to Scanning Tunneling Microscopy (Hardcover)

C. Julian Chen

ISBN 10: 0199211507 / ISBN 13: 9780199211500

Edité par Oxford University Press, Oxford, 2007

A propos de cet article

Hardcover. The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field. The second edition includes a number of newdevelopments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about theunderlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed ofscanning to observe life phenomena in real time is a key. Advanced in this direction is presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones ofnanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts. The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

N° de réf. du vendeur 9780199211500

Détails bibliographiques

• Titre: Introduction to Scanning Tunneling Microscopy (Hardcover)
• Éditeur: Oxford University Press, Oxford
• Date de parution: 2007
• Langue: anglais
• ISBN à 10 chiffres: 0199211507
• ISBN à 13 chiffres: 9780199211500
• Reliure: Hardcover
• Édition: 2ème Édition
• État de l'article: new

A propos de ce titre

Synopsis

The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field.

The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key. Advanced in this direction is presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.

À propos de l?auteur

Dr. C. Julian Chen
Senior Research Scientist
Department of Applied Physics and Applied Mathematics
Columbia University, New York.