Introduction to X-Ray Spectrometric Analysis

Eugene P. Bertin

ISBN 10: 0306310910 / ISBN 13: 9780306310911

Edité par Springer, 1978

Introduction to X-Ray Spectrometric Analysis | Eugene P. Bertin | Taschenbuch | xiv | Englisch | 1978 | Springer | EAN 9780306310911 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 101980441

Synopsis :

X-ray fluorescence spectrometry has been an established, widely practiced method of instrumental chemical analysis for about 30 years. However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif- fraction, very few offer full courses in x-ray spectrometric analysis. Those courses that are given are at the graduate level. Consequently, proficiency in this method must still be acquired by: self-instruction; on-the-job training and experience; "workshops" held by the x-ray instrument manu- facturers; the one- or two-week summer courses offered by a few uni- versities; and certain university courses in analytical and clinical chemistry, metallurgy, mineralogy. geology, ceramics. etc. that devote a small portion of their time to applications of x-ray spectrometry to those respective disciplines. Moreover, with all due respect to the books on x-ray spectrometric analysis now in print, in my opinion none is really suitable as a text or manual for beginners in the discipline. In 1968, when I undertook the writing of the first edition of my previous book, Principles and Practice of X-Ray Spectrometric Analysis, * my objective was to provide a student text. However, when all the material was compiled, I decided to provide a more comprehensive book, which was also lacking at that time. Although that book explains principles, instrumentation, and methods at the begin- ner's level, this material is distributed throughout a mass of detail and more advanced material.

Détails bibliographiques

Titre : Introduction to X-Ray Spectrometric Analysis
Éditeur : Springer
Date d'édition : 1978
Reliure : Taschenbuch
Etat : Neu