Microscopic Characterization Techniques: Scanning Electron Microscopy and Transmission Electron Microscopy

Yelwande, Ajeet Appasaheb; Navgire, Madhukar Eknath

ISBN 10: 6202797614 / ISBN 13: 9786202797610

Edité par LAP LAMBERT Academic Publishing, 2020

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N° de réf. du vendeur 26395830463

Détails bibliographiques

• Titre: Microscopic Characterization Techniques: Scanning Electron Microscopy and Transmission Electron Microscopy
• Éditeur: LAP LAMBERT Academic Publishing
• Date de parution: 2020
• Langue: anglais
• ISBN à 10 chiffres: 6202797614
• ISBN à 13 chiffres: 9786202797610
• Reliure: Couverture souple
• État de l'article: New

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Synopsis

Here in this book, we focus on the advanced, effective and widely used microscopic technique available for detection of morphological characterizations of materials. The principal objective is to provide a concise reading material on both practical and theoretical description of the techniques used to characterize a wide variety of materials. We discussed on the fundamental understanding, basic instrumentation, experimental strategy, analyses, and application part related to the scanning electron microscopy as well as transmission electron microscopy.