Microscopy of Semiconducting Materials 2007 : Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

A G Cullis

ISBN 10: 1402086148 / ISBN 13: 9781402086144

Edité par Springer, 2008

A propos de cet article

Druck auf Anfrage Neuware - Printed after ordering - This volume contains invited and contributed papers presented at the conference on 'Microscopy of Semiconducting Materials' held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.

N° de réf. du vendeur 9781402086144

Détails bibliographiques

• Titre: Microscopy of Semiconducting Materials 2007 : Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
• Éditeur: Springer
• Date de parution: 2008
• Langue: anglais
• ISBN à 10 chiffres: 1402086148
• ISBN à 13 chiffres: 9781402086144
• Reliure: Buch
• État de l'article: Neu
• Dimensions: 241 L x 167 H x 28 P (en millimètres) 241 millimètres de largeur par 167 millimètres de hauteur par 28 millimètres de profondeur
• Poids: 988 grammes

A propos de ce titre

Synopsis

This volume contains invited and contributed papers presented at the conference on 'Microscopy of Semiconducting Materials' held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.