Microstructural Characterization of Materials (Paperback)

David Brandon

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Langue : anglais

Edité par John Wiley & Sons Inc, New York, 2008

0470027851 / 9780470027851

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Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

N° de réf. du vendeur 9780470027851

Titre
Microstructural Characterization of Materials (Paperback)
Auteur
David Brandon
Éditeur
John Wiley & Sons Inc, New York
Année de publication
2008
État de l'article
new
Reliure
Paperback
Langue
anglais
ISBN à 10 chiffres
0470027851
ISBN à 13 chiffres
9780470027851
Édition
2ème Édition

AussieBookSeller

Truganina, VIC, Australie

Vendeur avec une évaluation de 5 étoiles

Vendeur AbeBooks depuis 22 juin 2007

Frais d'expédition de Australie vers Etats-Unis

Article25 à 45 jours ouvrés8 à 14 jours ouvrés
Premier articleEUR 31,82EUR 37,84
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