Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Singhee, Amith/ Rutenbar, Rob A.

ISBN 10: 9400736878 / ISBN 13: 9789400736870

Edité par Springer Verlag, 2013

A propos de cet article

2009 edition. 210 pages. 9.25x6.10x0.48 inches. In Stock.

N° de réf. du vendeur x-9400736878

Détails bibliographiques

• Titre: Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
• Éditeur: Springer Verlag
• Date de parution: 2013
• Langue: anglais
• ISBN à 10 chiffres: 9400736878
• ISBN à 13 chiffres: 9789400736870
• Reliure: Paperback
• État de l'article: Brand New

A propos de ce titre

Synopsis

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.

Présentation de l'éditeur

This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields.