OCM 2013 - Optical Characterization of Materials : Conference Proceedings

Beyerer, Juergen

ISBN 10: 3866449658 / ISBN 13: 9783866449657

Edité par KIT Scientific Publishing, 2013

Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages. N° de réf. du vendeur M03866449658-V

Synopsis :

The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

Présentation de l'éditeur: The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

Détails bibliographiques

Titre : OCM 2013 - Optical Characterization of ...
Éditeur : KIT Scientific Publishing
Date d'édition : 2013
Reliure : Couverture souple
Etat : very good