Performance Modeling and Design of Backscatter RFID Systems : A Statistical Approach

Jayjeet Govardhan

ISBN 10: 3639074378 / ISBN 13: 9783639074376

Edité par VDM Verlag Dr. Müller, VDM Verlag Dr. Müller E.K., 2008

A propos de cet article

Neuware - This book provides a statistical framework forperformance modeling and design of backscatter RadioFrequency Identification (RFID) systems.The current models for estimating performance arebased purely on EM theory (e.g., using Friis freespace equations) or statistical experimental modelingprinciples. Models based on EM theory are limited tospecifying power received at the tag under certainsimple, idealized conditions, and do not provideestimates of read-rates, which are de-facto industryquantifiers of an RFID system performance. On theother hand, the statistical models, being purelydata-driven, suffer from lack of generalizability astheir results cannot be extrapolated. This bookinvestigates a statistical approach for assessing thesystem performance and proposes an analyticalprobabilistic model based on Friis free spaceexpression that captures the uncertainties existingin gain of tag antenna, power of reader antenna, etc.Finally the book suggests a set of techniques toincrease read-rate probabilities of RFID tags in thepresence of highly metallic environments.

N° de réf. du vendeur 9783639074376

Détails bibliographiques

• Titre: Performance Modeling and Design of Backscatter RFID Systems : A Statistical Approach
• Éditeur: VDM Verlag Dr. Müller, VDM Verlag Dr. Müller E.K.
• Date de parution: 2008
• Langue: anglais
• ISBN à 10 chiffres: 3639074378
• ISBN à 13 chiffres: 9783639074376
• Reliure: Taschenbuch
• État de l'article: Neu

A propos de ce titre

Synopsis

This book provides a statistical framework for performance modeling and design of backscatter Radio Frequency Identification (RFID) systems. The current models for estimating performance are based purely on EM theory (e.g., using Friis free space equations) or statistical experimental modeling principles. Models based on EM theory are limited to specifying power received at the tag under certain simple, idealized conditions, and do not provide estimates of read-rates, which are de-facto industry quantifiers of an RFID system performance. On the other hand, the statistical models, being purely data-driven, suffer from lack of generalizability as their results cannot be extrapolated. This book in-vestigates a statistical approach for assessing the system performance and proposes an analytical probabilistic model based on Friis free space expression that captures the uncertainties existing in gain of tag antenna, power of reader antenna, etc. Finally the book suggests a set of techniques to increase read-rate probabilities of RFID tags in the presence of highly metallic environments.