Physical Methods for Materials Characterisation

Flewitt, P. E.J. and Wild, R. K.

ISBN 10: 0750308087 / ISBN 13: 9780750308083

Edité par Institute of Physics Publishing, 2003

A propos de cet article

This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1150grams, ISBN:9780750308083.

N° de réf. du vendeur 8991132

Détails bibliographiques

• Titre: Physical Methods for Materials Characterisation
• Éditeur: Institute of Physics Publishing
• Date de parution: 2003
• Langue: anglais
• ISBN à 10 chiffres: 0750308087
• ISBN à 13 chiffres: 9780750308083
• Reliure: Couverture souple
• Édition: 2ème Édition
• État de l'article: Fair
• Poids: 1150 grammes
• Catalogues du vendeur:
  • Science & Technology

A propos de ce titre

Synopsis

An updated version of the 1994 text, Physical Methods for Materials Characterization, this book provides a description of the large range of techniques in use for the characterization of the microstructure of materials. The characterization techniques covered include optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy.

Présentation de l'éditeur

In the second edition of this popular text, the authors provide a comprehensive description of the range of techniques currently used for characterizing the microstructure of materials. Introductory chapters cover the basic physics required to describe the microstructure of materials and their interaction with various types of radiation. Much of the hardware involved in these techniques is dependent on a vacuum environment, so a full chapter is devoted to this topic. Characterization techniques are then divided on the basis of the interrogating radiation, with separate chapters dealing with optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy. Within each chapter, material is given covering the radiation sources, the construction and layout of instrumentation and the analysis of data.

Comprehensively revised throughout, this edition reflects the rapid changes that have taken place recently. It contains additional material on a range of methods, including scanning probe techniques that reflect the need for analysis of materials at the nanoscale, and a detailed review of recent developments in data analysis and computing techniques.

Physical Methods for Materials Characterisation, Second Edition will be of interest to advanced undergraduates, postgraduates, and researchers in physics, materials science, and engineering.