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Ria Christie Collections, Uxbridge, Royaume-Uni
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In. N° de réf. du vendeur ria9781614345046_new
A thorough and in-depth preparation guide for PMP(R) and CAPM(R) exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.
Titre : Pmp/Capm Exam Prep: A Basic Guide to ...
Éditeur : Booklocker.Com Inc
Date d'édition : 2011
Reliure : Couverture souple
Etat : New