Power-Aware Testing and Test Strategies for Low Power.
ISBN 10: 1489983139 ISBN 13: 9781489983138
Edité par Springer, 2014
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A propos de cet article
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pp. 388. N° de réf. du vendeur 26356736238
Synopsis :
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
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Titre : Power-Aware Testing and Test Strategies for ...
Éditeur : Springer
Date d'édition : 2014
Reliure : Couverture souple
Etat : New
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Power-Aware Testing and Test Strategies for Low Power Devices
Edité par
Springer US, Springer New York Sep 2014, 2014
ISBN 10 : 1489983139
ISBN 13 : 9781489983138
Neuf
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