Random Fatigue : From Data to Theory

Sobczyk, K., Spencer, Jr., B. F.

ISBN 10: 0126542252 / ISBN 13: 9780126542257

Edité par Elsevier Science & Technology, 1992

Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects. N° de réf. du vendeur 12400303-6

Synopsis :

For many years fatigue has been a significant and difficult problem for engineers, especially for those who design structures such as aircraft, bridges, pressure vessels, and cranes. Fatigue of engineering materials is commonly regarded as an important deterioration process and a principal mode of failure for various structural and mechanical systems. This book presents a unified approach to stochastic modeling of the fatigue phenomenon, particularly the fatigue crack growth process. The main approaches to construction of these stochastic models are presented to show their methodological consistency and potential usefulness in engineering practice. The analyses contained in this work should also inspire the development of new approaches for designing and performing fatigue experiments.

Présentation de l'éditeur: For many years fatigue has been a significant and difficult problem for engineers, especially for those who design structures such as aircraft, bridges, pressure vessels, and cranes. Fatigue of engineering materials is commonly regarded as an important deterioration process and a principal mode of failure for various structural and mechanical systems. This book presents a unified approach to stochastic modeling of the fatigue phenomenon, particularly the fatigue crack growth process. The main approaches to construction of these stochastic models are presented to show their methodological consistency and potential usefulness in engineering practice. The analyses contained in this work should also inspire the development of new approaches for designing and performing fatigue experiments.

Détails bibliographiques

Titre : Random Fatigue : From Data to Theory
Éditeur : Elsevier Science & Technology
Date d'édition : 1992
Reliure : Couverture rigide
Etat : Very Good