Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale

Kalinin, Sergei V.; Gruverman, Alexei

ISBN 10: 0387286675 / ISBN 13: 9780387286679

Edité par Springer, 2006

2 Volume Set. Books are in excellent condition, text is unmarked and pages are tight. N° de réf. du vendeur sp592

Synopsis :

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Détails bibliographiques

Titre : Scanning Probe Microscopy (2 vol. set): ...
Éditeur : Springer
Date d'édition : 2006
Reliure : hardcover
Etat : As New