Scanning tunneling microscopy and spectroscopy. Theory, techniques, and applications.

D.A. Bonnell

ISBN 10: 3527279202 / ISBN 13: 9783527279203

Edité par New York, NY, VCH, 1993

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Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 3527279202 Sprache: Englisch Gewicht in Gramm: 550. N° de réf. du vendeur 2133752

Détails bibliographiques

Titre : Scanning tunneling microscopy and ...

Éditeur : New York, NY, VCH

Date d'édition : 1993

Reliure : Hardcover

A propos de ce titre

Présentation de l'éditeur:

Scanning tunneling microscopy (STM) provides three–dimensional real– space images of surfaces at high spatial resolution. When the surface is flat and clean, even atoms can be imaged. Its extreme usefulness has led it to near instantaneous acceptance as a characterization tool.

This book covers fundamental concepts of STM operation, image interpretation, instrumentation, and techniques for various applications. It als contains advanced treatments of theory and spectroscopy.
Surface physicists, electrochemists, materials scientists, and other scientists who see a use for STM will find the depth of coverage and accompanying reference lists in this book essential to their work. In addition, those who wish to add the capabilities of probe microscopy to their operations, such as microscopists and quality control engineers, will find the basic information in this book.