Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs (Solid Mechanics & Its Applications S)

Pinhong Chen; Kirkpatrick, Desmond A.; Keutzer, Kurt

ISBN 10: 1402080913 / ISBN 13: 9781402080913

Edité par Springer, 2004

A propos de cet article

The binding is tight and the spine is smooth. The cover has a couple of minor dents along the lower half in front and a slight dent along the front edge, near the middle. The bottom corners are lightly bumped. The pages are clean and unmarked and the book appears to be only lightly used. The previous owned has written their name on the inside of the front cover at the top but there are no other marks inside.
From the back cover: "All signoff analyses-timing, coupling, power, temperature, and reliability-rely on the analysis of crosstalk noise. This book is an important contribution to the field." 113 pp. Shelf: D-2.

N° de réf. du vendeur 251102LW

Détails bibliographiques

• Titre: Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs (Solid Mechanics & Its Applications S)
• Éditeur: Springer
• Date de parution: 2004
• Langue: anglais
• ISBN à 10 chiffres: 1402080913
• ISBN à 13 chiffres: 9781402080913
• Reliure: Couverture rigide
• État de l'article: Assez bon
• État de la jaquette: Pas de jaquette
• Dimensions: 0,51 L x 16,2 H x 24,44 P (centimètres) 0,51 centimètres de largeur par 16,2 centimètres de hauteur par 24,44 centimètres de profondeur
• Poids: 0,463 livre
• Catalogues du vendeur:
  • NONFICTION
  • Education
  • Science

A propos de ce titre

Synopsis

As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst case delay. The latter approach not only reduces delay calculation accuracy, but can also be shown to underestimate the delay in certain scenarios.
This book describes accurate but conservative methods for computing delay variation due to coupling. Furthermore, most of these methods are computationally efficient enough to be employed in a static timing analysis tool for complex integrated digital circuits. To achieve accuracy, a more accurate computation of the Miller factor is derived. To achieve both computational efficiency and accuracy, a variety of mechanisms for pruning the search space are detailed, including:

-Spatial pruning - reducing aggressors to those in physical proximity,
-Electrical pruning - reducing aggressors by electrical strength,
-Temporal pruning - reducing aggressors using timing windows,
-Functional pruning - reducing aggressors by Boolean functional analysis.