Statistical Methods for SPC and TQM

D Bissell

ISBN 10: 0412394405 / ISBN 13: 9780412394409

Edité par Springer Netherlands, 1994

A propos de cet article

Neuware - Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.ContentsData Collection and Graphical SummariesNumerical Data Summaries-Location and DispersionProbability and DistributionSampling, Estimation, and ConfidenceSample Tests of Hypothesis; 'Significance Tests'Control Charts for Process Management and ImprovementControl Charts for Average and VariationControl Charts for 'Single-Valued' ObservationsControl Charts for Attributes and EventsControl Charts: Problems and Special CasesCusum MethodsProcess Capability-Attributes, Events, and Normally Distributed DataCapability; Non-Normal DistributionsEvaluating the Precision of a Measurement System (Gauge Capability)Getting More from Control Chart DataSPC in 'Non-Product' ApplicationsAppendices.

N° de réf. du vendeur 9780412394409

Détails bibliographiques

• Titre: Statistical Methods for SPC and TQM
• Éditeur: Springer Netherlands
• Date de parution: 1994
• Langue: anglais
• ISBN à 10 chiffres: 0412394405
• ISBN à 13 chiffres: 9780412394409
• Reliure: Buch
• État de l'article: Neu

A propos de ce titre

Synopsis

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; "Significance Tests" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for "Single-Valued" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in "Non-Product" Applications Appendices

À propos de l?auteur

D Bissell