Stochastic models in reliability theory. proceedings of a symposium, held in Nagoya, Japan, April 23 - 24, 1984.

Osaki, S.:

ISBN 10: 3540138889 / ISBN 13: 9783540138884

Edité par Springer, 1984

A propos de cet article

Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Sp 78 3540138889 Sprache: Englisch Gewicht in Gramm: 550. N° de réf. du vendeur 2096323

Détails bibliographiques

Titre : Stochastic models in reliability theory. ...

Éditeur : Springer

Date d'édition : 1984

Reliure : Couverture souple

A propos de ce titre

Synopsis :

In Japan there are many research workers who are especially inter- ested in stochastic models in reliability theory. On the above back- ground, it was a nice occasion for the Editors to organize the Reliabil- ity Symposium with emphasis on "Stochastic Models in Reliability Theory." The Reliability Symposium was held in Nagoya, Japan, April 23-24, 1984. In the Symposium there were 14 contributions of the recent research works on stochastic models in reliability theory in Japan. We briefly sketch all the contributions by the following classifications just for conveni- ence. The first three papers discuss coherent structure theory: Miyakawa considers stochastic coherent systems where the system's state can not be completely determined by the states of its components. He shows that such models will be used in identifying the failure mechanism based on failure pattern data. Ohi and Nishida propose multistate systems in which all the state spaces are not necessarily the same, but somewhat strong coherency is assumed. Nakashima and Yamato discuss multivalued- output systems and su gest the type of redundancy effective for improv- ing- fail-safe characteristics of such systems. The next two papers are concerned with maintenance and replacement problems: Nakagawa summarizes seven replacement models with discrete variables. He shows that each optimal number is given by a unique solu- tion to equation. Kaio and Osaki consider optimum inspection policies for a system whose failure can be detected effectively. They discuss three inspection models and give their optimum inspection policies.