Surface Analysis : The Principal Techniques

John C Vickerman

ISBN 10: 0470017635 / ISBN 13: 9780470017630

Edité par Wiley Mai 2009, 2009

A propos de cet article

Neuware - This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis.Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.

N° de réf. du vendeur 9780470017630

Détails bibliographiques

• Titre: Surface Analysis : The Principal Techniques
• Éditeur: Wiley Mai 2009
• Date de parution: 2009
• Langue: anglais
• ISBN à 10 chiffres: 0470017635
• ISBN à 13 chiffres: 9780470017630
• Reliure: Buch
• Édition: 2ème Édition
• État de l'article: Neu
• Dimensions: 250 L x 175 H x 41 P (en millimètres) 250 millimètres de largeur par 175 millimètres de hauteur par 41 millimètres de profondeur
• Poids: 1349 grammes

A propos de ce titre

Synopsis

Die Theorie und Praxis der Oberflächenanalyse wird von Experten mehrerer Fachgebiete erläutert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.

À propos de l?auteur

John C. Vickerman BSc in Chemistry (Edinburgh), Ph.D. in Surface Chemistry (Bristol), DSc (Bristol). Predoctoral fellowships at the Universities of Perugia and Rome, postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. Sabbatical study periods at the University of Munich, the Free University of Berlin and Pennsylvania State University.

Dr Ian Gilmore, Surface and Nano-Analysis, National Physical Laboratory, Teddington, UK
Ian is a Principal Research Scientist in the Surface and Nano-Analysis Research team and joined NPL in 1991. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static static SIMS called gentle-SIMS or G-SIMS,
He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. Ian is a Fellow of the Institute of Physics a member of the EPSRC College and a member of the American Vacuum Society.