Surface Engineering 2001 ? Fundamentals and Applications: Volume 697 (MRS Proceedings) Meng, Wen Jin; Kumar, Ashok; Doll, Gary L.; Cheng, Yang-Tse; Veprek, Stan and Chung, Yip-Wah

ISBN 10: 1558996338 / ISBN 13: 9781558996335

Edité par Cambridge University Press, 2002

A propos de cet article

N° de réf. du vendeur EZ114946

Détails bibliographiques

• Titre: Surface Engineering 2001 ? Fundamentals and Applications: Volume 697 (MRS Proceedings) Meng, Wen Jin; Kumar, Ashok; Doll, Gary L.; Cheng, Yang-Tse; Veprek, Stan and Chung, Yip-Wah
• Éditeur: Cambridge University Press
• Date de parution: 2002
• Langue: anglais
• ISBN à 10 chiffres: 1558996338
• ISBN à 13 chiffres: 9781558996335
• Reliure: Couverture rigide
• État de l'article: New

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Synopsis

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Présentation de l'éditeur

Representing a relatively new and interdisciplinary field, this book, first published in 2002, explores the linkages between surface engineering and tribology across engineering fields, from the MEMs industry to the traditional machinery industry, to the transportation industry. While the characteristic size of the respective mechanical systems varies from nano- to tens of meters, overall performance critically depends on the near-surface mechanical, thermal and tribological behavior. Advances in surface engineering technologies enable surfaces with superior wear resistance, friction behavior and corrosion characteristics, without altering the desired bulk mechanical properties. This provides opportunities to engineer next-generation mechanical systems well beyond the current performance envelope. A better understanding of the tribological behavior of engineered surfaces is the key to the future success of many new (e.g. MEMS) and old (e.g. machinery and transportation) industries. Advances on surface engineering materials, technologies and tribology are addressed in the book, as are numerical simulations and modeling related to the same issues.