Topics in Electron Diffraction and Microscopy of Materials

Peter. B (University Of Oxford Hirsch

ISBN 10: 075030538X / ISBN 13: 9780750305389

Edité par Taylor & Francis Ltd Jan 1999, 1999

A propos de cet article

Neuware - This book has been written following a festschrift held on Prof Mike Whelan's retirement from the University of Oxford. It brought together a who's who of electron microscopists all of whom have advanced the uses of microscopy to study materials. Contributions include: Hirsch on the history and impact of electron microscopy in Materials Science; Cockayne (University of Sydney, Australia) writes on weak-beam techniques for problem solving, understanding defect structures and dislocation interactions; Moodie (Royal Melbourne Institute of Technology) investigates how to use beam diffraction patterns to look at defects in structures; Hashimoto (Okayama University of Science) shows how to obtain chemical identification at atomic resolution; Dudarev (Oxford) outlines theoretical developments in back sctarring channeling patterns; Humphreys (Cambridge) finds new ways to look at atomic bonds; Howie (Cambridge) uses numerical simulations to look at electronic structure of crystals; Peng (Chinese Academy of Sciences) illuminates Rheed observations for MBE growth; and Spence (Arizona State) speculates on atomic level imaging. applications; novel.

N° de réf. du vendeur 9780750305389

Détails bibliographiques

• Titre: Topics in Electron Diffraction and Microscopy of Materials
• Éditeur: Taylor & Francis Ltd Jan 1999
• Date de parution: 1999
• Langue: anglais
• ISBN à 10 chiffres: 075030538X
• ISBN à 13 chiffres: 9780750305389
• Reliure: Buch
• État de l'article: Neu
• Dimensions: 241 L x 162 H x 18 P (en millimètres) 241 millimètres de largeur par 162 millimètres de hauteur par 18 millimètres de profondeur
• Poids: 432 grammes

A propos de ce titre

Synopsis

Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

À propos de l?auteur

Peter. B Hirsch