VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

Sengupta, Anirban

ISBN 10: 9813297662 / ISBN 13: 9789813297661

Edité par Springer 2019-08, 2019

A propos de cet article

N° de réf. du vendeur 6666-IUK-9789813297661

Détails bibliographiques

• Titre: VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
• Éditeur: Springer 2019-08
• Date de parution: 2019
• Langue: anglais
• ISBN à 10 chiffres: 9813297662
• ISBN à 13 chiffres: 9789813297661
• Reliure: PF
• État de l'article: New

A propos de ce titre

Synopsis

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.