VLSI-SoC: The Advanced Research for Systems on Chip

Salvador Mir

ISBN 10: 3642327699 / ISBN 13: 9783642327698

Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg Aug 2012, 2012

A propos de cet article

This item is printed on demand - Print on Demand Titel. Neuware -This book contains extended and revised versions of the best papers presented at the 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, held in Hong Kong, China, in October 2011. The 10 papers included in the book were carefully reviewed and selected from the 45 full papers and 16 special session papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 200 pp. Englisch.

N° de réf. du vendeur 9783642327698

Détails bibliographiques

• Titre: VLSI-SoC: The Advanced Research for Systems on Chip
• Éditeur: Springer Berlin Heidelberg, Springer Berlin Heidelberg Aug 2012
• Date de parution: 2012
• Langue: anglais
• ISBN à 10 chiffres: 3642327699
• ISBN à 13 chiffres: 9783642327698
• Reliure: Buch
• État de l'article: Neu

A propos de ce titre

Synopsis

This book contains extended and revised versions of the best papers presented at the 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, held in Hong Kong, China, in October 2011. The 10 papers included in the book were carefully reviewed and selected from the 45 full papers and 16 special session papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.