VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers (IFIP Advances in Information and Communication Technology)

Shin, Youngsoo (Editor) / Tsui, Chi Ying (Editor) / Kim, Jae-Joon (Editor) / Choi, Kiyoung (Editor) / Reis, Ricardo (Editor)

ISBN 10: 3319834401 / ISBN 13: 9783319834405

Edité par Springer, 2018

A propos de cet article

rep rev edition. 240 pages. 9.25x6.10x0.63 inches. In Stock. N° de réf. du vendeur 3319834401

Détails bibliographiques

Titre : VLSI-SoC: Design for Reliability, Security, ...

Éditeur : Springer

Date d'édition : 2018

Reliure : Paperback

Etat : Brand New

A propos de ce titre

Synopsis :

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.