Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l'Optique des Rayons X et la Microanalyse

Gottfried Möllenstedt

ISBN 10: 3662228459 / ISBN 13: 9783662228456

Edité par Springer Berlin Heidelberg, Springer, 1969

A propos de cet article

Druck auf Anfrage Neuware - Printed after ordering - The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanforcl. California in 1962, and at Orsay, Francein 1965. The participants in the 1961-l Conferenct came from the following countries: Germany 140, France 60, Great Britain 55, USA 20. Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine. Poland, South Africa. As at the latest congress in Paris the following central topics were treated: Gentral problems of X-ray optics, physical bases of electron beam microanalysis. quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for tht car eful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation.

N° de réf. du vendeur 9783662228456

Détails bibliographiques

• Titre: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l'Optique des Rayons X et la Microanalyse
• Éditeur: Springer Berlin Heidelberg, Springer
• Date de parution: 1969
• Langue: allemand
• ISBN à 10 chiffres: 3662228459
• ISBN à 13 chiffres: 9783662228456
• Reliure: Taschenbuch
• État de l'article: Neu
• Dimensions: 235 L x 155 H x 34 P (en millimètres) 235 millimètres de largeur par 155 millimètres de hauteur par 34 millimètres de profondeur
• Poids: 937 grammes

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Synopsis

The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanforcl. California in 1962, and at Orsay, Francein 1965. The participants in the 1961-l Conferenct> came from the following countries: Germany 140, France 60, Great Britain 55, USA 20. Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine. Poland, South Africa. As at the latest congress in Paris the following central topics were treated: Gent>ral problems of X-ray optics, physical bases of electron beam microanalysis. quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal- lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for tht> car-eful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation.