Wideband Microwave Materials Characterization

John Schultz

ISBN 10: 1630819468 / ISBN 13: 9781630819460

Edité par Artech House Publishers, 2023

2023. Hardcover. . . . . . Books ship from the US and Ireland. N° de réf. du vendeur V9781630819460

Synopsis :

Determining intrinsic microwave properties or extrinsic performance of materials is important for a variety of applications, including wireless propagation, antenna and microwave circuit design, and remote sensing, among others. This practical engineering guide to microwave material measurements discusses both laboratory and manufacturing/field environments. Modern technology has created a need to adapt microwave measurement methods for in-line quality assurance, in-situ process control, and field inspection of materials and components. The book covers the various configurations for free-space measurements, but also provides guidance on calibration methods, signal processing, and intrinsic property inversion algorithms. Learn how the modern adaptation of impedance analysis to CEM inversion methods and how this powerful new technique can be used to significantly improve conventional measurement methods. Intended to inform engineers and scientists of the theory and practice of wide-band microwave characterization of materials, this guide provides the necessary theory and equations for implementing these methods and gives hints and techniques for their practical implementation.

À propos de l?auteur: John Schultz is the Chief Scientist at Compass Technology Group, a small engineering company that specializes in electromagnetic materials measurements and the development of measurement devices. He received a B.A. in Physics (1987) from the University of Maryland, a M.S. in Physics (1990) from the University of Texas at Austin, and a Ph.D. in Materials Engineering (1997) from the University of Dayton. At the beginning of his career, he worked as an intel analyst both for several defense companies and then for the U.S. Air Force at the Air Force Information Warfare Center. From 1998 to 2013 he was research faculty at the Georgia Tech Research Institute, where he attained the rank of Tech Fellow. Since 2013, he has led research and product development efforts at Compass Technology Group. He is lead author on dozens of journal and conference publications, hundreds of technical reports, and has over half a dozen patents.

Détails bibliographiques

Titre : Wideband Microwave Materials Characterization
Éditeur : Artech House Publishers
Date d'édition : 2023
Reliure : Couverture rigide
Etat : New