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Ajouter au panierMass Market Paperback. Etat : Good. Please see any and all photos connected with this listing. A bit scuffed but all pages intact and legible. Good reading copies. Clean. Store Stamped. --- --- FINAL FLIGHT --- The most daring -- and deadly -- terrorist plot of all time is about to unfold aboard the supercarrier USS United States. If it succeeds, the balance of nuclear power will tilt in favor of a remorseless Arab leader. And it looks as if no one can stop it - except navy "jet jock" Jake Grafton. "Cag " Grafton is one helluva pilot. His F-14 Tomcat is one helluva plane. But some of Jake's crewmates have already vanished. A woman reporter who boarded the ship in Tangiers may not be who she claims to be. And Jake may have to disobey a direct order from the President himself for one spine-tingling, hair-raising Final Flight --- AMBUSH AT OSIRAK --- This military thriller centers on American counterspy David Llewelln's attempts to defuse an escalating Israeli/Iraqi conflict, save Iraq's Osirak atomic reactor from Israeli attack, and prevent a major international war. . .
Langue: anglais
Edité par CliffsNotes (edition 4), 2017
ISBN 10 : 0544651081 ISBN 13 : 9780544651081
Vendeur : BooksRun, Philadelphia, PA, Etats-Unis
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Ajouter au panierPaperback. Etat : Fair. 4. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way. Workbook.
Langue: anglais
Edité par CliffsNotes (edition 4), 2017
ISBN 10 : 0544651081 ISBN 13 : 9780544651081
Vendeur : BooksRun, Philadelphia, PA, Etats-Unis
EUR 17,80
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Ajouter au panierPaperback. Etat : Very Good. 4. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting. Workbook.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 15,60
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Ajouter au panierEtat : New.
Vendeur : Lakeside Books, Benton Harbor, MI, Etats-Unis
EUR 14,41
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Ajouter au panierEtat : New. Brand New! Not Overstocks or Low Quality Book Club Editions! Direct From the Publisher! We're not a giant, faceless warehouse organization! We're a small town bookstore that loves books and loves it's customers! Buy from Lakeside Books!
Langue: anglais
Edité par Wipf & Stock Publishers 1/18/2018, 2018
ISBN 10 : 1532643667 ISBN 13 : 9781532643668
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Ajouter au panierPaperback or Softback. Etat : New. The Field Is the World: A History of the Canton Mission (1929-1949) of the Churches of Christ. Book.
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EUR 17,67
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Ajouter au panierEtat : As New. Unread book in perfect condition.
Langue: anglais
Edité par Wipf and Stock 1/18/2018, 2018
ISBN 10 : 1532643667 ISBN 13 : 9781532643668
Vendeur : Windows Booksellers, Eugene, OR, Etats-Unis
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Ajouter au panierPaperback. New book. 152 pp.
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Ajouter au panierEtat : New. Brand New! Not Overstocks or Low Quality Book Club Editions! Direct From the Publisher! We're not a giant, faceless warehouse organization! We're a small town bookstore that loves books and loves it's customers! Buy from Lakeside Books!
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Ajouter au panierPaperback. Etat : Brand New. 127 pages. 8.50x5.50x0.50 inches. In Stock.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Ajouter au panierPF. Etat : New.
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
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Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
EUR 23,50
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Ajouter au panierEtat : As New. Unread book in perfect condition.
Langue: anglais
Edité par Wipf & Stock Publishers, 2018
ISBN 10 : 1532643675 ISBN 13 : 9781532643675
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 38,65
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Ajouter au panierEtat : New. In.
Vendeur : Revaluation Books, Exeter, Royaume-Uni
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Ajouter au panierHardcover. Etat : Brand New. 156 pages. 5.50x0.44x8.50 inches. In Stock.
Vendeur : Books From California, Simi Valley, CA, Etats-Unis
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Ajouter au panierhardcover. Etat : Very Good.
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Ajouter au panierEtat : As New. Unread book in perfect condition.
Langue: anglais
Edité par Wipf and Stock Publishers, 2018
ISBN 10 : 1532643667 ISBN 13 : 9781532643668
Vendeur : PBShop.store US, Wood Dale, IL, Etats-Unis
EUR 24,36
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Ajouter au panierPAP. Etat : New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Langue: anglais
Edité par Springer Nature Switzerland AG, Cham, 2020
ISBN 10 : 303053328X ISBN 13 : 9783030533281
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EUR 131,83
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Ajouter au panierHardcover. Etat : new. Hardcover. This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
EUR 129,49
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Ajouter au panierEtat : New.
EUR 127,86
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EUR 142,08
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Ajouter au panierEtat : New. pp. 347.
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Ajouter au panierTaschenbuch. Etat : Neu. Introduction to Statistics in Metrology | Stephen Crowder (u. a.) | Taschenbuch | xxi | Englisch | 2021 | Springer | EAN 9783030533311 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
EUR 149,79
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Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
EUR 149,79
Quantité disponible : 1 disponible(s)
Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.