Applied Life Data Analysis

Nelson, Wayne

ISBN 10: 0471094587 / ISBN 13: 9780471094586

Edité par John Wiley & Sons/Wiley Interscience, New York, Chichester, Brisbane, 1982

A propos de cet article

Octavo; VG-/G-; off-white spine with black text; first printing; dust jacket shows light toning; closed tear to front joint; one or two minor chips otherwise; cloth exterior has very mild wear; slight lean to spine; text block exterior edges have very light tone; illustrated endpapers; small spot to dedication page; clean interior depicting figures, charts and graphs; pp 634. 1363120. FP New Rockville Stock. N° de réf. du vendeur 1363120

Détails bibliographiques

Titre : Applied Life Data Analysis

Éditeur : John Wiley & Sons/Wiley Interscience, New York, Chichester, Brisbane

Date d'édition : 1982

Reliure : Hardcover

Etat de la jaquette : Jaquette

Edition : First Printing.

A propos de ce titre

Synopsis :

Book by Nelson Wayne B

Biographie de l'auteur:

DR. WAYNE NELSON IS AWARDED THE SHEWHART MEDAL

American Society for Quality awarded Dr. Wayne Nelson of Schenectady, New York the 2003 Shewhart Medal. The Medal honors his outstanding technical leadership, particularly for innovative developments and applications of theory and methods for analyzing quality, reliability, and accelerated test data, and for widely disseminating such developments through his books and many publications, talks, and courses.

The Shewhart Medal for outstanding technical leadership is named after Dr. Walter A. Shewhart, who pioneered statistical methods for controlling and improving the quality of manufactured products. These methods contributed significantly to the United States′ war effort in World War II. Subsequently taken to Japan by Dr. W. Edwards Deming, these methods revolutionized Japan′s industries. Today these methods are part of widely used Six Sigma training on how to improve the quality of products and services.

The American Society for Quality is the world′s largest professional society dedicated to the improved quality of products and services. It serves its members and the public through a variety of educational activities, including conferences, training courses, journals, and books.

Dr. Nelson is a graduate of the California Institute of Technology (Caltech) and the Univiversity of Illinois. Formerly with GE Research & Development, he now privately consults and gives courses for companies, professional societies, and universities. For his technical contributions, he was elected a Fellow of the American Society for Quality, the American Statistical Association, and the Institute of Electrical and Electronic Engineers. He recently spent four months in Argentina on a Fulbright Award, lecturing on analysis of product reliability data.