Digital Systems Testing & Testable Design

Abramovici, Miron

ISBN 10: 0780310624 / ISBN 13: 9780780310629

Edité par Wiley-IEEE Press, 1994

A propos de cet article

Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).

N° de réf. du vendeur 000238935U

Détails bibliographiques

• Titre: Digital Systems Testing & Testable Design
• Éditeur: Wiley-IEEE Press
• Date de parution: 1994
• Langue: anglais
• ISBN à 10 chiffres: 0780310624
• ISBN à 13 chiffres: 9780780310629
• Reliure: hardcover
• Édition: 1st Edition.
• État de l'article: Good

A propos de ce titre

Synopsis

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

À propos de l?auteur

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.

Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.

Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.